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HTS heading · chapter 90

9031

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof

Analysis

Heading 9031 of the Harmonized Tariff Schedule covers measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof. It divides into 6 six-digit subheadings and 15 eight-digit tariff lines, with 21 ten-digit statistical suffixes below them.

14 of its 15 lines with a percentage rate are duty-free at the general rate (93%) and 1 are dutiable, from duty-free up to 1.7%. The median line pays duty-free.

The largest subheadings are 9031.90 (parts and accessories, 6 lines), 9031.49 (other, 4 lines), 9031.80 (other instruments, appliances and machines, 2 lines) and 9031.10 (unnamed, 1 line).

Its median rate of duty-free sits at the 37th percentile of the headings in chapter 90.

By Census's concordance, most of its statistical lines are made by Commercial and Service Industry Machinery Manufacturing (33331), Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals (334515) and All Other General Purpose Machinery Manufacturing (33399). Those are the NAICS industries a US producer of these goods would report under.

Tariff lines

LineDescriptionGeneral rate
9031.10.00Machines for balancing mechanical partsFree
9031.20.00Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: test benches1.7%
9031.41.00For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)Free
9031.49.10Profile projectorsFree
9031.49.40Coordinate-measuring machinesFree
9031.49.70For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesFree
9031.49.90Other: otherFree
9031.80.40Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesFree
9031.80.80Other instruments, appliances and machines: otherFree
9031.90.21Of profile projectorsFree
9031.90.45Bases and frames for the coordinate-measuring machines of subheading 9031.49.40Free
9031.90.54Of optical instruments and appliances of subheading 9031.41 or 9031.49.70Free
9031.90.59Of other optical instruments and appliances, other than test benches: otherFree
9031.90.70Of articles of subheading 9031.80.40Free
9031.90.91Other: otherFree