◆classifyanything

HTS tariff line · chapter 90

9031.41.00

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

Analysis

HTS 9031.41.00 covers for inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor… under heading 9031 (measuring or checking instruments, appliances and machines, not specified or included…). US Customs collects import statistics for it under 3 ten-digit suffixes, reported in number of items.

Within this group the rate runs from duty-free to 1.7%. Compared with 9031.20.00 (measuring or checking instruments, appliances and machines, not…), which pays 1.7%, a misclassification either way moves the duty by 1.7 percentage points.

Goods from countries without normal trade relations pay the column 2 rate of 50% instead of nothing, so origin decides between free entry and a 50% duty.

The normal trade relations rate here is zero, shared by about 73% of the 296 tariff lines in chapter 90, a useful check when a neighbouring dutiable line is a candidate. Duty-free at the general rate does not rule out additional duties under Chapter 99, such as Section 301 or Section 232 measures, which depend on the country of origin.

Statistical suffixes

CodeDescriptionUnitsNAICS
9031.41.00.20For inspecting photomasks or reticles used in manufacturing semiconductor devicesNo.33331
9031.41.00.40For wafersNo.33331
9031.41.00.60OtherNo.33331

Neighbouring lines

LineDescriptionGeneral rate
9031.10.00Machines for balancing mechanical partsFree
9031.20.00Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: test benches1.7%
9031.49.10Profile projectorsFree
9031.49.40Coordinate-measuring machinesFree
9031.49.70For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devicesFree
9031.49.90Other: otherFree
9031.80.40Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticlesFree
9031.80.80Other instruments, appliances and machines: otherFree
9031.90.21Of profile projectorsFree
9031.90.45Bases and frames for the coordinate-measuring machines of subheading 9031.49.40Free
9031.90.54Of optical instruments and appliances of subheading 9031.41 or 9031.49.70Free
9031.90.59Of other optical instruments and appliances, other than test benches: otherFree
9031.90.70Of articles of subheading 9031.80.40Free
9031.90.91Other: otherFree