HTS tariff line · chapter 90
9031.20.00
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: test benches
Analysis
HTS 9031.20.00 covers measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories… under heading 9031 (measuring or checking instruments, appliances and machines, not specified or included…).
The general duty rate is 1.7% of the customs value, which is above most the rates in chapter 90 (79th percentile of 296 lines with an ad valorem rate). On a shipment valued at $10,000 that is $170 in duty before any Chapter 99 additions or preference claims.
Within this group the rate runs from duty-free to duty-free. Compared with 9031.90.91 (other: other), which pays duty-free, a misclassification either way moves the duty by 1.7 percentage points.
The column 2 rate, for countries without normal trade relations, is 45%, 26.5 times the general rate.
Goods that qualify under GSP, the Australia FTA, the Bahrain FTA, the Chile FTA, the Colombia TPA, and 12 others can enter duty-free instead of paying 1.7%. It is also eligible under GSP, the developing-country programme, which Congress has to renew; check whether GSP is in force on the entry date.
Neighbouring lines
| Line | Description | General rate |
|---|---|---|
| 9031.10.00 | Machines for balancing mechanical parts | Free |
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |
| 9031.49.10 | Profile projectors | Free |
| 9031.49.40 | Coordinate-measuring machines | Free |
| 9031.49.70 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free |
| 9031.49.90 | Other: other | Free |
| 9031.80.40 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free |
| 9031.80.80 | Other instruments, appliances and machines: other | Free |
| 9031.90.21 | Of profile projectors | Free |
| 9031.90.45 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free |
| 9031.90.54 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Free |
| 9031.90.59 | Of other optical instruments and appliances, other than test benches: other | Free |
| 9031.90.70 | Of articles of subheading 9031.80.40 | Free |
| 9031.90.91 | Other: other | Free |